Resultats de la cerca

Orientation and phase mapping in the transmission electron microscope using precession‐assisted diffraction spot recognition: state‐of‐the‐art results per Désirée Viladot, M. Véron, Mauro Gemmi, F. Peiró, J. Portillo, Sònia Estradé, Joan Mendoza, Núria Llorca-Isern, Stavros Nicolopoulos

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Shaping single walled nanotubes with an electron beam per Alberto Zobelli, Alexandre Gloter, Chris Ewels, C. Colliex

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3D structure of individual nanocrystals in solution by electron microscopy per Jungwon Park, Hans Elmlund, Peter Ercius, Jong Min Yuk, David T. Limmer, Qian Chen, Kwanpyo Kim, Sang Hoon Han, David A. Weitz, Alex Zettl, A. Paul Alivisatos

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Ultrastructure, Morphology and Organization of Biogenic Magnetite from Sockeye Salmon, <i>Oncorhynchus Nerka</i>: Implications for Magnetoreception per Stephen Mann, N.H.C. Sparks, Michael M. Walker, Joseph L. Kirschvink

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Insights into the physical chemistry of materials from advances in HAADF-STEM per Karl Sohlberg, Timothy J. Pennycook, Wu Zhou, Stephen J. Pennycook

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Aberration‐Corrected Imaging of Active Sites on Industrial Catalyst Nanoparticles per Lionel C. Gontard, Shery L. Y. Chang, Crispin Hetherington, Angus I. Kirkland, Doğan Özkaya, Rafal E. Dunin‐Borkowski

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Green Synthesis of Silver Nanoparticles Using Extracts of &amp;lt;i&amp;gt;Ananas comosus&amp;lt;/i&amp;gt; per Naheed Ahmad, S. Sharma

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Depth sectioning with the aberration-corrected scanning transmission electron microscope per Albina Y. Borisevich, Andrew R. Lupini, Stephen J. Pennycook

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Biological imaging with 4D ultrafast electron microscopy per David J. Flannigan, Brett Barwick, Ahmed H. Zewail

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Electron tomography at 2.4-ångström resolution per Mary Scott, Chien‐Chun Chen, Matthew Mecklenburg, Chun Zhu, Rui Xu, Peter Ercius, U. Dahmen, B. C. Regan, Jianwei Miao

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Recent Advances in Electron Tomography: TEM and HAADF-STEM Tomography for Materials Science and Semiconductor Applications per Christian Kübel, Andreas Voigt, Remco Schoenmakers, Max T. Otten, David Su, Tan-Chen Lee, Anna Carlsson, J. P. Bradley

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Scanning Transmission Electron Microscopy at High Resolution per J.S. Wall, John P. Langmore, M. Isaacson, A. V. Crewe

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Transmission electron microscopy (TEM) of Earth and planetary materials: A review per Martin Lee

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Resolution of coherent and incoherent imaging systems reconsidered - Classical criteria and a statistical alternative per Sandra Van Aert, D. Van Dyck, Arnold J. den Dekker

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Atomic structure of three-layer Au/Pd nanoparticles revealed by aberration-corrected scanning transmission electron microscopy per D. Ferrer, Douglas A. Blom, Lawrence F. Allard, Sergio Mejía-Rosales, E. Pérez‐Tijerina, Miguel José Yácaman

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Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction per E.F. Rauch, J.L. Portillo, Stavros Nicolopoulos, D. Bultreys, Sergei Rouvimov, Peter Moeck

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Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy per W. Coene, Guido Janssen, Marc Op De Beeck, D. Van Dyck

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New observations of the hierarchical structure of human enamel, from nanoscale to microscale per Fuzhai Cui, Jun Ge

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Atomic-Resolution Imaging with a Sub-50-pm Electron Probe per Rolf Erni, Marta D. Rossell, Christian Kisielowski, U. Dahmen

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Time resolved electron microscopy for <i>in situ</i> experiments per Geoffrey H. Campbell, Joseph T. McKeown, Melissa K. Santala

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