Torthaí cuardaigh - Nicolas Bernier

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    Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope

    Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope de réir David Cooper, Thibaud Denneulin, Nicolas Bernier, Armand Béché, Jean‐Luc Rouvière

    Foilsithe / Cruthaithe 2015
    Faigh an téacs iomlán
    Artigo
    Cuir le mo chuid Ceanán
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