Zoekresultaten - Jonnard, Philippe

Study of interface reaction in a B(4)C/Cr mirror at elevated temperature using soft X-ray reflectivity door Modi, Mohammed H., Gupta, Shruti, Yadav, Praveen K., Gupta, Rajkumar, Bose, Aniruddha, Mukherjee, Chandrachur, Jonnard, Philippe, Idir, Mourad

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EUV stimulated emission from MgO pumped by FEL pulses door Jonnard, Philippe, André, Jean-Michel, Le Guen, Karine, Wu, Meiyi, Principi, Emiliano, Simoncig, Alberto, Gessini, Alessandro, Mincigrucci, Riccardo, Masciovecchio, Claudio, Peyrusse, Olivier

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High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region door Huang, Qiushi, Yi, Qiang, Cao, Zhaodong, Qi, Runze, Loch, Rolf A., Jonnard, Philippe, Wu, Meiyi, Giglia, Angelo, Li, Wenbin, Louis, Eric, Bijkerk, Fred, Zhang, Zhong, Wang, Zhanshan

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Realization of wafer-scale nanogratings with sub-50 nm period through vacancy epitaxy door Huang, Qiushi, jia, Qi, Feng, Jiangtao, Huang, Hao, Yang, Xiaowei, Grenzer, Joerg, Huang, Kai, Zhang, Shibing, Lin, Jiajie, Zhou, Hongyan, You, Tiangui, Yu, Wenjie, Facsko, Stefan, Jonnard, Philippe, Wu, Meiyi, Giglia, Angelo, Zhang, Zhong, Liu, Zhi, Wang, Zhanshan, Wang, Xi, Ou, Xin

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