Risultati della ricerca - Jonnard, Philippe

Study of interface reaction in a B(4)C/Cr mirror at elevated temperature using soft X-ray reflectivity di Modi, Mohammed H., Gupta, Shruti, Yadav, Praveen K., Gupta, Rajkumar, Bose, Aniruddha, Mukherjee, Chandrachur, Jonnard, Philippe, Idir, Mourad

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EUV stimulated emission from MgO pumped by FEL pulses di Jonnard, Philippe, André, Jean-Michel, Le Guen, Karine, Wu, Meiyi, Principi, Emiliano, Simoncig, Alberto, Gessini, Alessandro, Mincigrucci, Riccardo, Masciovecchio, Claudio, Peyrusse, Olivier

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High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region di Huang, Qiushi, Yi, Qiang, Cao, Zhaodong, Qi, Runze, Loch, Rolf A., Jonnard, Philippe, Wu, Meiyi, Giglia, Angelo, Li, Wenbin, Louis, Eric, Bijkerk, Fred, Zhang, Zhong, Wang, Zhanshan

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Realization of wafer-scale nanogratings with sub-50 nm period through vacancy epitaxy di Huang, Qiushi, jia, Qi, Feng, Jiangtao, Huang, Hao, Yang, Xiaowei, Grenzer, Joerg, Huang, Kai, Zhang, Shibing, Lin, Jiajie, Zhou, Hongyan, You, Tiangui, Yu, Wenjie, Facsko, Stefan, Jonnard, Philippe, Wu, Meiyi, Giglia, Angelo, Zhang, Zhong, Liu, Zhi, Wang, Zhanshan, Wang, Xi, Ou, Xin

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