Suchergebnisse - Jonnard, Philippe

Study of interface reaction in a B(4)C/Cr mirror at elevated temperature using soft X-ray reflectivity von Modi, Mohammed H., Gupta, Shruti, Yadav, Praveen K., Gupta, Rajkumar, Bose, Aniruddha, Mukherjee, Chandrachur, Jonnard, Philippe, Idir, Mourad

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EUV stimulated emission from MgO pumped by FEL pulses von Jonnard, Philippe, André, Jean-Michel, Le Guen, Karine, Wu, Meiyi, Principi, Emiliano, Simoncig, Alberto, Gessini, Alessandro, Mincigrucci, Riccardo, Masciovecchio, Claudio, Peyrusse, Olivier

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High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region von Huang, Qiushi, Yi, Qiang, Cao, Zhaodong, Qi, Runze, Loch, Rolf A., Jonnard, Philippe, Wu, Meiyi, Giglia, Angelo, Li, Wenbin, Louis, Eric, Bijkerk, Fred, Zhang, Zhong, Wang, Zhanshan

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Realization of wafer-scale nanogratings with sub-50 nm period through vacancy epitaxy von Huang, Qiushi, jia, Qi, Feng, Jiangtao, Huang, Hao, Yang, Xiaowei, Grenzer, Joerg, Huang, Kai, Zhang, Shibing, Lin, Jiajie, Zhou, Hongyan, You, Tiangui, Yu, Wenjie, Facsko, Stefan, Jonnard, Philippe, Wu, Meiyi, Giglia, Angelo, Zhang, Zhong, Liu, Zhi, Wang, Zhanshan, Wang, Xi, Ou, Xin

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