Canlyniadau Chwilio - Jonnard, Philippe

Study of interface reaction in a B(4)C/Cr mirror at elevated temperature using soft X-ray reflectivity gan Modi, Mohammed H., Gupta, Shruti, Yadav, Praveen K., Gupta, Rajkumar, Bose, Aniruddha, Mukherjee, Chandrachur, Jonnard, Philippe, Idir, Mourad

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EUV stimulated emission from MgO pumped by FEL pulses gan Jonnard, Philippe, André, Jean-Michel, Le Guen, Karine, Wu, Meiyi, Principi, Emiliano, Simoncig, Alberto, Gessini, Alessandro, Mincigrucci, Riccardo, Masciovecchio, Claudio, Peyrusse, Olivier

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High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region gan Huang, Qiushi, Yi, Qiang, Cao, Zhaodong, Qi, Runze, Loch, Rolf A., Jonnard, Philippe, Wu, Meiyi, Giglia, Angelo, Li, Wenbin, Louis, Eric, Bijkerk, Fred, Zhang, Zhong, Wang, Zhanshan

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Realization of wafer-scale nanogratings with sub-50 nm period through vacancy epitaxy gan Huang, Qiushi, jia, Qi, Feng, Jiangtao, Huang, Hao, Yang, Xiaowei, Grenzer, Joerg, Huang, Kai, Zhang, Shibing, Lin, Jiajie, Zhou, Hongyan, You, Tiangui, Yu, Wenjie, Facsko, Stefan, Jonnard, Philippe, Wu, Meiyi, Giglia, Angelo, Zhang, Zhong, Liu, Zhi, Wang, Zhanshan, Wang, Xi, Ou, Xin

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