检索结果 - Jian‐Min Zuo

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    TEM based high resolution and low-dose scanning electron nanodiffraction technique for nanostructure imaging and analysis

    TEM based high resolution and low-dose scanning electron nanodiffraction technique for nanostructure imaging and analysis 由 Kyou-Hyun Kim, Hui Xing, Jian‐Min Zuo, Peng Zhang, Haifeng Wang

    出版 2015
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  2. 2
    Coherent nano‐area electron diffraction

    Coherent nano‐area electron diffraction 由 Jian‐Min Zuo, Min Gao, Jing Tao, B.Q. Li, R. D. Twesten, I. Petrov

    出版 2004
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